Bhattacharyya, A.S and Ramgiri, Praveen Kumar (2015) Thin films stress modeling : a novel approach. (Unpublished)

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A novel approach to estimate the thin film stress was discussed based on surface tension. The effect of temperature and film thickness was studies. The effect of stress on the film mechanical properties was observed.

Item Type:Article
Subjects:Q Science > Q0 Interdisciplinary sciences > Q01 Interdisciplinary sciences (General)
ID Code:290
Deposited By:Dr Arnab Bhattacharyya
Deposited On:28 Oct 2015 08:30
Last Modified:28 Oct 2015 08:32

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